Abstract:

Based on the voltage value sequences collected by SD-1 dynamic raw silk size tester, this paper uses NI-cRIO platform with built-in FPGA module which has μs time-control feature and 9014 real-time control system and has developed a high-speed detection system for the evenness and cleanness of raw silk in order to realize fast, accurate, several spindles’ on-line inspection and analysis. The main difficulty is to determine the algorithm reliability by using FPGA to compute 6 end channels, and display the results simultaneously and generate report forms for follow-up statistics and analysis，thus meeting the needs of inspection of defects in evenness of raw silks and subjective evaluation of the grade of raw silks. The goal to raise the efficiency of quality testing of raw silks of this study is realized.