JOURNAL OF TEXTILE RESEARCH ›› 2005, Vol. 26 ›› Issue (2): 121-123.
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Fabric blemish detection based on attributed relational histogram
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Abstract: Based on linear feature texture of fabric,achieved statistic histogram can abstract fabric characteristics perfectly.These feature waves show reliable and stable during numerous tests.With comparing wave features,abrupt or abnormal changes can be located precisely and fabric defects can be picked out correctly.To simplify identification,threshold filter should be introducd to overpass general wave and record abnormal status.Discrimination of various and complex defects can form a simple by filtering general unique texture.
Fabric blemish detection based on attributed relational histogram. Fabric blemish detection based on attributed relational histogram[J].JOURNAL OF TEXTILE RESEARCH, 2005, 26(2): 121-123.
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